Comprion launches SWP/HCI NFC testing solution

By Sarah Clark | NearFieldCommunicationsWorld.com | 27 October 2009, 09:32

Mobile test equipment specialist Comprion has launched a digital Single Wire Protocol (SWP) and Host Controller Interface (HCI) simulator that allows the synchronous simulating and testing of both the contact and contactless sides of NFC communication.

According to the official announcement:

Comprion combines the simulation capabilities of its SWP/HCI tester Prove 2 with its NFC tester CLT One. Prove 2 is a digital SWP and HCI card simulator for CLF testing featuring the latest tests according to ETSI TS 102 694-1 (SWP) and ETSI TS 102 695-1 (HCI). CLT One is a card/tag simulator for contactless testing supporting ISO/IEC 14443 Type A and B.

With the new test solution, synchronous simulating and testing of both the contact and contactless sides of NFC communication is now available. Recordings of both tools can be processed and displayed in just one comprehensive software application. This allows for accurate and easily accessible timing measurements on the same single time scale and protocol analysis across interfaces and technologies.

As some of the ETSI SWP and HCI test cases demand an NFC simulator to be involved, the new Comprion solution will assure SWP/HCI and NFC compliance. Comprion is still actively involved in creating ETSI test specifications for SWP and HCI protocols. Thus, new conformance tests can be implemented into the Prove 2 in parallel with the progress of the test specifications.

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